Color Reference and Spectroscopy Standards
Catalog Number:
(76537-088)
Supplier:
Audit Microcontrols
Description:
Linearity FD iPTH for Abbott Systems is a five level linearity set intended to simulate human patient serum samples for purpose of determining lineari...
Supplier:
Electron Microscopy Sciences
Description:
A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
Supplier:
Electron Microscopy Sciences
Description:
All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems
Supplier:
FIREFLYSCI, INC.
Description:
Firefly's FUV neutral density solid-state filter series tests photometric accuracy in the UV and VIS range from 200-700nm. Our solid-state nano-deposi...
Supplier:
FIREFLYSCI, INC.
Description:
Firefly’s FUV Dual Series filters allow you to verify photometric accuracy and stray light in the range of 200 - 700 nm. Includes certified values for...
Supplier:
Electron Microscopy Sciences
Description:
All standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.
Supplier:
Electron Microscopy Sciences
Description:
USAF resolution charts are recognized as a universal standard for testing the vertical and horizontal resolution of imaging systems.
Supplier:
Electron Microscopy Sciences
Description:
The X-Checker™ was the first and remains the only complete calibration aid for SEM/EDS Systems.
Catalog Number:
(102099-050)
Supplier:
Electron Microscopy Sciences
Description:
Sulphide Minerals/Oxide Heavy Metals Standards Block
Catalog Number:
(76016-844)
Supplier:
FIREFLYSCI, INC.
Description:
Firefly's equivalent of the NIST SRM 1930 calibration reference kit for testing photometric accuracy in the VIS range (400 to 700 nm).
Supplier:
Electron Microscopy Sciences
Description:
All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems. All of ou...
Supplier:
Electron Microscopy Sciences
Description:
These standards are supplied as fine powders that are dispersed onto holey-carbon films and are selected from the range of certified natural and synth...
Catalog Number:
(102093-152)
Supplier:
Electron Microscopy Sciences
Description:
The IAM-MET is a multi-morphology calibration standard designed specifically for ASTM.
Catalog Number:
(76468-748)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.
Catalog Number:
(76016-848)
Supplier:
FIREFLYSCI, INC.
Description:
Kit consists of three filters and a blank for validating photometric accuracy and linearity in the range of 200 to 3000 nm.
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