Electron Microscopy Sciences
Supplier:
Electron Microscopy Sciences
Description:
All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.
Supplier:
Electron Microscopy Sciences
Description:
MAC X-ray Microanalysis standards are supplied as 33 m (1/4") diameter pressed pellets or metal foils, and are prepared from sel...
Supplier:
Electron Microscopy Sciences
Description:
These standards are supplied as fine powders that are dispersed onto holey-carbon films and are selected from the range of certified natural and synth...
Supplier:
Electron Microscopy Sciences
Description:
A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
Supplier:
Electron Microscopy Sciences
Description:
When equipped with a back-scattered electron detector, an electron microscope has the capability to produce images in which the contrast is controlled...
Supplier:
Electron Microscopy Sciences
Description:
All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems
Supplier:
Electron Microscopy Sciences
Description:
All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.
Supplier:
Electron Microscopy Sciences
Description:
USAF resolution charts are recognized as a universal standard for testing the vertical and horizontal resolution of imaging systems.
Supplier:
Electron Microscopy Sciences
Description:
All standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.
Supplier:
Electron Microscopy Sciences
Description:
Spray droplet sizing reticle for size and distribution assessments of aersol droplets. Used in conjunction with a 40x Microscope for direct measuremen...
Supplier:
Electron Microscopy Sciences
Description:
Particle-size standards are certified for mean diameter and are traceable to the National Bureau of Standards (NBS). Duke Scientific's new line of sta...
Catalog Number:
(102099-048)
Supplier:
Electron Microscopy Sciences
Description:
Geological/Silicate Material Standards Block
Supplier:
Electron Microscopy Sciences
Description:
MAC has developed multi-element blocks of reference materials suitable for the compilation of a reference library of Auger sensitivity factors when us...
Catalog Number:
(100492-374)
Supplier:
Electron Microscopy Sciences
Description:
The TEM Checker contains 5 manganese discs in a standard grid storage box. The discs are not transparent to the beam but gives a strong manganese peak...
Supplier:
Electron Microscopy Sciences
Description:
Standards Co (Cobalt) is compulsory for checking energy dispersive analyzers.
Supplier:
Electron Microscopy Sciences
Description:
The X-Checker™ was the first and remains the only complete calibration aid for SEM/EDS Systems.
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