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ELECTRON MICROSCOPY SCIENCE
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ELECTRON MICROSCOPY SCIENCE
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Holey Thick Carbon Grid, Copper only, ultra-flat, for TEM, Manufactured without plastics, clean and without residue, Ultra-flat for better particle dispersion and more uniform ice thickness, Multihole device has staggered pattern of six features, Hole size: 4.0 um, Hole spacing: 2.0um, TEM mesh: 300
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Wafer, Silicon, silver Coated, P-Type, 4in, 0.525 mm thick, high quality silver coated substrates are coated under vacuum using electron beam evaporation with 500 Angstroms of silver with a thin titanium adhesion layer (2-7 nm) between the glass and coating, Dimensions: 100 mm
Catalog Number:
(76468-652)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem wafer holder, are made from aluminum and feature brass clips which secure the wafers, Each holder comes with a 0.125 (3.2mm) pin of 0.375 (9.5mm) length, Accomodates 4 (100 mm) diameter wafer, Size: 100 mm.
Catalog Number:
(76468-446)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Afm/Stm Dual Vise, With Set Screw, Make it easy to clamp and position cross sectional samples for AFM imaging, Easy to attach to the magnetic sample holder of the AFM system, Compatible with most AFM systems, High quality stainless steel.
Catalog Number:
(76468-578)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
SEM specimen mount, with shorter pin and slotted head for use with all Zeiss/LEO SEM, FESEM & FIB systems, Made from ultra-pure aluminum with a standard lathe finish, Head: 2.5, Pin height: 6 mm, Pin diameter: 3.2 mm, 63mm
Catalog Number:
(76468-810)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Handling Tong, Using the handling tongs, freeze drying pots can be stacked onto a freeze drying Stage.
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Porta-Wand wafer handling tool kit, comes with a non-removable 9.6V NiMH rechargeable battery, Easy push-button on/off control, Replaceable internal air filter is accessible from the front of the tool, Includes: ESD-safe flat wafer tip and 115V In-stand Charger, For upto 4in wafers
Catalog Number:
(76468-558)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
SEM specimen mount, Rectangular for use with Hitachi S-5200/S-5500/SU-9000, Made from ultra-pure aluminum, 11 mm x 5.5 mm Size: 5.5 mm.
Catalog Number:
(76468-404)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Porta-Vac II, With Peek Tip For 6in Wafers, comes complete with a disposable 9V battery and a molded PEEK wafer tip, A large switch provides easy on/off control, Includes: Molded PEEK wafer tip and 9V Disposable Battery.
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Vacuum Wand, Molded Peek Tip, 6in wafers, Wafer tips made from PEEK, a high performance plastic and are able to be used in Porta-Wand, Porta-Vac II, and EMS Vacuum Wand Kits, Withstand temperatures up to 100C, Thin profile to allow easy access to wafers.
Catalog Number:
(76468-618)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem Pin Stub Adapter, Used to adapt 1/8 (3.1mm) pin diameter SEM stubs, Made from vacuum grade aluminum with a stainless steel set screw, Allen wrench included, Diameter: 16 mm, Height: 25 mm.
Catalog Number:
(76468-650)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem wafer holder, are made from aluminum and feature brass clips which secure the wafers, Each holder comes with a 0.125 (3.2mm) pin of 0.375 (9.5mm) length, Accomodates 3 (76 mm) diameter wafer, Size: 76 mm.
Catalog Number:
(76468-718)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Resolution Gold On C, Low Voltage, Larger gold particles in this test allow for a higher contrast and smaller gaps allow resolution to be measured, This helps to make the test easier to use when operating conditions are not optimal, Type: ISI Stub.
Catalog Number:
(76468-376)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Vacuum Tool Esd, 9mm Cups, For use with the EDS vacuum tool
Catalog Number:
(76468-442)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Mount, 90deg Afm/Stm, With Spring Clip, Make it easy to clamp and position cross sectional samples for AFM imaging, Easy to attach to the magnetic sample holder of the AFM system, Compatible with most AFM systems, High quality stainless steel.
Catalog Number:
(76468-576)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
SEM specimen mount, with shorter pin and slotted head for use with all Zeiss/LEO SEM, FESEM & FIB systems, Made from ultra-pure aluminum with a standard lathe finish, Head: 2.5, Pin height: 6 mm, Pin diameter: 3.2 mm, 63mm
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 is still displayed and you need assistance, please call us at 1-800-932-5000.
Stock for this item is limited, but may be available in a warehouse close to you. Please make sure that you are logged in to the site so that available stock can be displayed. If the
is still displayed and you need assistance, please call us at 1-800-932-5000.
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