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Graticules Reticles and Grids
Catalog Number:
(102773-584)
Supplier:
Electron Microscopy Sciences
Description:
The 3 post copper lift-out grids include multiple indexed mounting locations with both vertical bars and 'V' shaped attachment surfaces.
Supplier:
Electron Microscopy Sciences
Description:
A uniqulye designed standard with four different grid size patterns: 0.5×0.5 mm grid with 25 µm pitch; 1×1 mm grid with 50 µm pitch; 2×2 mm grid with ...
Supplier:
Electron Microscopy Sciences
Description:
Graphene is a single atomic layer of carbon atoms tightly packed in a two-dimensional honeycomb lattice, ideal TEM support film.
Supplier:
Electron Microscopy Sciences
Description:
Stage graticules are used for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when...
Supplier:
Electron Microscopy Sciences
Description:
Veco Grids offer superior handling characteristics.
Catalog Number:
(76499-692)
Supplier:
Electron Microscopy Sciences
Description:
Designed for CD-TEM metrology of large specimens, like 3D NAND FIB lamella.
Catalog Number:
(102681-294)
Supplier:
Electron Microscopy Sciences
Description:
Custom beryllium half ring grids.
Catalog Number:
(102681-296)
Supplier:
Electron Microscopy Sciences
Description:
Custom copper 5-post lift-out grids specially designed for in-situ lift-out. These grids include multiple indexed mounting locations, all with ve...
Catalog Number:
(102773-586)
Supplier:
Electron Microscopy Sciences
Description:
The 3 post copper lift-out grids are specifically designed for in-situ lift-out. These grids include multiple indexed mounting locations with both ver...
Supplier:
Electron Microscopy Sciences
Description:
Useful for area of specimen determinations, especially rectangular shapes, also for particle counting.
Supplier:
Electron Microscopy Sciences
Description:
The specimen is racked on the mechanical stage of the microscope and traverses are taken right across thee deposit sizing all the particles encountere...
Catalog Number:
(100492-372)
Supplier:
Electron Microscopy Sciences
Description:
The latex sphere is 0.261 microns and the grating replica is 2160 lines/mm.
Supplier:
Electron Microscopy Sciences
Description:
Please note that for calibration the circles and globes will represent particles smaller in diameter by the magnification of the objective.
Supplier:
Electron Microscopy Sciences
Description:
Unique index grids for all microscopy work, are manufactured in the strictest accordance to meet AHERA requirements.
Supplier:
Electron Microscopy Sciences
Description:
Athene grids are renowned for the highest quality mesh for transmission electron microscope.
Supplier:
Electron Microscopy Sciences
Description:
Used for measurement of large objects in conjunction with a graduated mechanical stage, and for alignment as well.
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 is still displayed and you need assistance, please call us at 1-800-932-5000.
Stock for this item is limited, but may be available in a warehouse close to you. Please make sure that you are logged in to the site so that available stock can be displayed. If the
is still displayed and you need assistance, please call us at 1-800-932-5000.
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