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ELECTRON MICROSCOPY SCIENCE
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ELECTRON MICROSCOPY SCIENCE
Catalog Number:
(76468-642)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem Specimen Block 8 Clips, Engraved specimen block, Numbered, Measures 12 x 48 mm, Comes complete with pin, The 8 clip is numbered 1-8.
Catalog Number:
(76468-622)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Ebsd Holder, Made from aluminum, this holder for EBSD has a built-in 70 degree pre-tilt angle, Comes complete with stainless steel screws and allen key, Accommodates 1 (25mm) mount, Size: 25 mm.
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
ExP Vacuum Wand wafer handling kit, lower cost alternative to the Porta-Wand and Porta-Vac II systems, which share the same tips, Has a push-button to close the vacuum and release the wafer, Comes with 1/8 coiled hose and stand, Includes: Molded PEEK wafer tip, coiled hose and stand, For 6in wafers
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
E-Beam Lithography Mount, This aluminum mount features an M4 threaded hole and is 25mm in dia, Copper clips, The mount comes complete with a Faraday Cup (2.5mm x 100nm hole) and a gold/carbon resolution sample 3mm in dia, is included, The gold particle size range is 5-150nm.
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem Scintillator Yap, (Yttrium Aluminum Perovskite activated by Ce3+) has low phosphor noise, resistance to radiation damage, and long life, YAP is more efficient in terms of light output than YAG crystals, Use with Cambridge S600 scanning electron microscopes, Size: 12.0X1mm
Catalog Number:
(76468-564)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
SEM specimen mount, with M4 large for use with Hitachi, Made from ultra-pure aluminum with a standard lathe finish, Head: 4, Height: 4.5 mm, 100mm, large
Catalog Number:
(76468-832)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Single Tilt Holder, Jeol Sem 2-Position, single tilt multi-grid holder, Will accommodate 6 grids with an easy click stop reproducible movement between each specimen, It is ideal for scanning through serial sections or for comparing against a standard.
Catalog Number:
(76468-794)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem Stub Freeze Dry Holder, Our aluminum stub holder offers many uses, including holding (3.1 mm) pin stubs for freeze drying, Has a diameter of 3.1 mm and holds five pin stubs.
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem Scintillator Yap, (Yttrium Aluminum Perovskite activated by Ce3+) has low phosphor noise, resistance to radiation damage, and long life, YAP is more efficient in terms of light output than YAG crystals, Use with Amray except1200, JEOL 50 scanning electron microscopes, Size: 20.0X1mm
Catalog Number:
(76468-608)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Mini SEM stub specimen mount with shorter pin (6 mm) for use with all Zeiss/LEO scanning electron microscopes, FE-SEMs & FIB systems, Made of stainless steel, Head: 6.6 x 1.3 mm, Pin height: 6.25 mm.
Catalog Number:
(76468-478)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Pin stub mount, with 12 divisions for use with FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan and Camscan SEMs, Made from ultra-pure aluminum with a standard lathe finish, Head: 32 mm, Pin height: 9 mm, Pin diameter: 3.2 mm, Dimension: 32mm
Catalog Number:
(76468-590)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Cylinder specimen mount, are for use with JEOL1 scanning electron microscopes, The mount, are made from ultra-pure aluminum with a standard lathe finish, Head: 1, Height: 8 mm.
Catalog Number:
(76468-500)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
SEM specimen mount, with shorter pin and slotted head for use with Zeiss/LEO 1500 SEM, FESEM & FIB systems, Made from ultra-pure aluminum with a standard lathe finish, Head: 1, Pin height: 6 mm, Pin diameter: 3.2 mm.
Catalog Number:
(76468-786)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Emf3 Replacement Odor Element, Replacement part for the EMF3 oil mist filter, The EMF3 is used with the Edwards E2M1.5 vacuum pump.
Catalog Number:
(76468-486)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Pin stub mount, with slotted head for use with Leica, Cambridge, LEO, FEI, Phillips, PHENOM, Zeiss, Camscan, Made from ultra-pure aluminum with a standard lathe finish, Head: 38 mm, Pin height: 8 mm, Pin diameter: 1/8, Dimension: 38mm
Catalog Number:
(76468-574)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
SEM specimen mount with shorter pin and slotted head for use with all Zeiss/LEO SEM, FESEM & FIB systems, Made from ultra-pure aluminum with a standard lathe finish, Head: 18 mm, Pin height: 6 mm, Pin diameter: 3.2 mm, 18mm
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Stock for this item is limited, but may be available in a warehouse close to you. Please make sure that you are logged in to the site so that available stock can be displayed. If the
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