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ELECTRON MICROSCOPY SCIENCE
Catalog Number:
(76468-488)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Pin stub mount, with slotted head for use with Leica, Cambridge, LEO, FEI, Phillips, PHENOM, Zeiss, Camscan, Made from ultra-pure aluminum with a standard lathe finish, Head: 38 mm, Pin height: 8 mm, Pin diameter: 1/8, Dimension: 38mm
Catalog Number:
(76468-502)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
SEM specimen mount, with shorter pin and slotted head for use with Zeiss/LEO 1500 SEM, FESEM & FIB systems, Made from ultra-pure aluminum with a standard lathe finish, Head: 1-1/4, Pin height: 6 mm, Pin diameter: 1/8mm
Catalog Number:
(76468-790)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Vacuum Pump Exhaust Filter, Removes visible oil mist and smoke from rotary vacuum pump exhaust even if saturated with oil, The filter continuously drains the collected liquid, allowing recovery of lubricating fluid.
Catalog Number:
(76318-724)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Mold Cold Embedding Form PK5, The form mold is a two part mounting cup, designed to be as user-friendly as possible. It has practical handles for removing of the lid and the cylinder is slightly conical for easy removal of the mounts. Diameter: 30 mm.
Catalog Number:
(76439-654)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Holey Thick Carbon Grid, Copper Only, An ultra-flat, for TEM, Manufactured without plastics, it is clean and without residue, Ultra-flat for better particle dispersion and more uniform ice thickness, Hole Size: 2um, Hole spacing: 4 um, TEM Mesh: 300
Catalog Number:
(76439-684)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Holey Thick Carbon Grid, Copper Only, An ultra-flat, for TEM, Manufactured without plastics, it is clean and without residue, Ultra-flat for better particle dispersion and more uniform ice thickness, Hole Size: 2 um, Hole spacing: 4 um, TEM Mesh: 300
Catalog Number:
(76439-670)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Holey Thick Carbon Grid, Copper Only, An ultra-flat, for TEM, Manufactured without plastics, it is clean and without residue, Ultra-flat for better particle dispersion and more uniform ice thickness, Hole Size: 2um, Hole spacing: 2 um, TEM Mesh: 300
Catalog Number:
(76439-660)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Holey Thick Carbon Grid, copper only, An ultra-flat, for TEM, Manufactured without plastics, it is clean and without residue, Ultra-flat for better particle dispersion and more uniform ice thickness, TEM mesh: 300
Catalog Number:
(76468-660)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
SEM specimen prep stand, Aluminum, that can hold pin mount, on a 45 angle and in a vertical and horizontal direction, Screws to secure the mount during prep, 0.5 and 1 mount, can be accommodated, Measures 2.75 ( 70mm) x 2 (50mm) x 1.6 (40mm).
Catalog Number:
(76468-752)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem Scintillator Yap, (Yttrium Aluminum Perovskite activated by Ce3+) has low phosphor noise, resistance to radiation damage, and long life, YAP is more efficient in terms of light output than YAG crystals, Use with Phillip Quad Detector, Size: 6.2X1mm
Catalog Number:
(76468-656)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Wafer Holder, For Notch Wafers, made from aluminum and feature brass clips which secure the wafers, Each holder comes with a 0.125 (3.2mm) pin of 0.375 (9.5mm) length, Pin: 100 mm.
Catalog Number:
(76468-654)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem wafer holder, are made from aluminum and feature brass clips which secure the wafers, Each holder comes with a 0.125 (3.2mm) pin of 0.375 (9.5mm) length, Accomodates 5 (150 mm) diameter wafer, Size: 150 mm.
Catalog Number:
(76468-378)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Needle Vacuum Tool, With Esd 4mm Cup, For use with the EMS EDS vacuum tool
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem Scintillator Yap, (Yttrium Aluminum Perovskite activated by Ce3+) has low phosphor noise, resistance to radiation damage, and long life, YAP is more efficient in terms of light output than YAG crystals, Use with ETEC scanning electron microscopes, Size: 9.0X3mm
Catalog Number:
(76468-742)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Tin On Carbon, Low Mag Specimen, This low magnification test has a size range of 1 - 10um for table-top SEM, Has a magnification range of 250-5,000x, Can be used on FESEM and FIB as well, Type: ISI Stub.
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
ExP Vacuum Wand wafer handling kit, lower cost alternative to the Porta-Wand and Porta-Vac II systems, which share the same tips, Has a push-button to close the vacuum and release the wafer, Comes with 1/8 coiled hose and stand, Includes: Molded PEEK wafer tip, coiled hose and stand, For 8in wafers
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 is still displayed and you need assistance, please call us at 1-800-932-5000.
Stock for this item is limited, but may be available in a warehouse close to you. Please make sure that you are logged in to the site so that available stock can be displayed. If the
is still displayed and you need assistance, please call us at 1-800-932-5000.
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