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ELECTRON MICROSCOPY SCIENCE
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ELECTRON MICROSCOPY SCIENCE
Catalog Number:
(76468-816)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
JEOL 2-Position Single Tilt Holder, are held in place by easy to remove circlips, Comes complete with loading stand, circlip extraction tool, and is supplied in its own mahogany box.
Catalog Number:
(76468-710)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
FlexScribe Station, is a flexible and affordable scribing workstation for dicing, downsizing, extracting and cross-sectioning small samples up to 200 mm wafers.
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Probe Kit, Material: Nylon Plastic, Made from PEEK high performance plastic with chemical resistantance, Withstands temperatures to 300 deg C, For electronic areas to labss, from preparation of samples to applying adhesives, Use as a stirring rod or dosing samples
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Holey Thick Carbon Grid, Copper Only, An ultra-flat, for TEM, Manufactured without plastics, it is clean and without residue, Ultra-flat for better particle dispersion and more uniform ice thickness, Hole Size: 1.2 um, Hole spacing: 1.3 um, TEM Mesh: 300
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Holey Thick Carbon Grid, Copper only, An ultra-flat, for TEM, Manufactured without plastics, it is clean and without residue, Ultra-flat for better particle dispersion and more uniform ice thickness, Multihole device has a staggered pattern of six features, TEM mesh: 300
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Carbon PEEK Probes Kit, Material: Plastic, Made from PEEK high performance plastic with chemical resistantance, Withstands temperatures to 300 deg C, For electronic areas to labss, from preparation of samples to applying adhesives, Use as a stirring rod or dosing samples
Catalog Number:
(76468-292)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Glass Strip, Ultramicrotomy, Specially selected glass strips for making glass knives, Its hardness produces a durable and sharp edge suitable for thick, semi thin, or ultrathin sections, Dimension: 6X25.4X406mm
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Specimen Punch, Standard Base 2.3mm, Prepare high-quality disk specimens from thin metal foils with the EMS 130 Specimen Punch, A precision ground punch and die plate eliminate specimen stress and distortion, Base: Standard base, Size: 1.0 x 1.1in Hieght: 2.5in
Catalog Number:
(76468-542)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
SEM specimen mount, 45degree, low profile, for use with FEI, Tescan, Zeiss, Philips, LEO, Cambridge, Amray, Leica, CamScan, ETEC, Made from ultra-pure aluminum, Head: 1/2, Pin height: 3/8inch, 12.7mm
Catalog Number:
(76468-358)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Vacuum Cup, Handi-Vac-2 has an improved tip designed for better lifting capacity utilizing larger, non-marking vacuum cups, This new tip also enhances functionality and improves accuracy when picking and placing parts, ESD safe, Dimension: 3/8inch
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Microscope Slide, Gold Substrate Coated, Material: Soda lime glass, high quality substrates are coated under vacuum using electron beam evaporation with 500 Angstroms (50 nm) of gold with a thin chromium adhesion layer (2-7 nm) between the glass and coating, Dimensions: 25 x 75 mm
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Wafer, Silicon, Type P, 3in, can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer, The wafers are polished on one side, Diameter: 76 mm, Orientation: <111>, Thickness: 345-470 um, Roughness: 2nm, Resistance: 1-30 ohms.
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Disc, Gold Coated, For Afm, High quality - made of magnetic stainless steel coated with 1um gold, Smooth edges and consistently flat surfaces to ensure secure holding, Specimens can be mounted directly on the metal Disc with double sided tape, epoxy or conductive paste, Diameter: 12 mm.
Catalog Number:
(76468-510)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem Pin Stub, Slotted Head, Cambridge, Phillips, Camscan, B&L, Etec, Zeiss SEM specimen mounts, Tapered end pin, slotted head, Head: 1/2, Pin height: 6 mm, Pin diameter: 1/8mm, 12.7mm
Catalog Number:
(76318-682)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Mold Cold Embedding Flexible PK2, This rectangular flexible mold is made of very flexible transparent silicone rubber which makes it very easy to remove the mounts. Polished inner sides. Size: 68 x 37 x 35 mm.
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Wafer, Ultra-Flat Silicon, 8in, can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer, Diameter: 200 mm, Orientation: <100>, Thickness: 725 um +/- 20 um, Roughness: Typically 2-3 armstrong, Resistivity: 10-20 Ohm-cm.
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 is still displayed and you need assistance, please call us at 1-800-932-5000.
Stock for this item is limited, but may be available in a warehouse close to you. Please make sure that you are logged in to the site so that available stock can be displayed. If the
is still displayed and you need assistance, please call us at 1-800-932-5000.
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