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ELECTRON MICROSCOPY SCIENCE
Catalog Number:
(76468-660)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
SEM specimen prep stand, Aluminum, that can hold pin mount, on a 45 angle and in a vertical and horizontal direction, Screws to secure the mount during prep, 0.5 and 1 mount, can be accommodated, Measures 2.75 ( 70mm) x 2 (50mm) x 1.6 (40mm).
Catalog Number:
(76468-752)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem Scintillator Yap, (Yttrium Aluminum Perovskite activated by Ce3+) has low phosphor noise, resistance to radiation damage, and long life, YAP is more efficient in terms of light output than YAG crystals, Use with Phillip Quad Detector, Size: 6.2X1mm
Catalog Number:
(76468-656)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Wafer Holder, For Notch Wafers, made from aluminum and feature brass clips which secure the wafers, Each holder comes with a 0.125 (3.2mm) pin of 0.375 (9.5mm) length, Pin: 100 mm.
Catalog Number:
(76468-654)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem wafer holder, are made from aluminum and feature brass clips which secure the wafers, Each holder comes with a 0.125 (3.2mm) pin of 0.375 (9.5mm) length, Accomodates 5 (150 mm) diameter wafer, Size: 150 mm.
Catalog Number:
(76468-378)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Needle Vacuum Tool, With Esd 4mm Cup, For use with the EMS EDS vacuum tool
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem Scintillator Yap, (Yttrium Aluminum Perovskite activated by Ce3+) has low phosphor noise, resistance to radiation damage, and long life, YAP is more efficient in terms of light output than YAG crystals, Use with ETEC scanning electron microscopes, Size: 9.0X3mm
Catalog Number:
(76468-742)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Tin On Carbon, Low Mag Specimen, This low magnification test has a size range of 1 - 10um for table-top SEM, Has a magnification range of 250-5,000x, Can be used on FESEM and FIB as well, Type: ISI Stub.
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
ExP Vacuum Wand wafer handling kit, lower cost alternative to the Porta-Wand and Porta-Vac II systems, which share the same tips, Has a push-button to close the vacuum and release the wafer, Comes with 1/8 coiled hose and stand, Includes: Molded PEEK wafer tip, coiled hose and stand, For 8in wafers
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem Scintillator Yap, (Yttrium Aluminum Perovskite activated by Ce3+) has low phosphor noise, resistance to radiation damage, and long life, YAP is more efficient in terms of light output than YAG crystals, Use with ISI Mini-SEM, Jeol scanning electron microscopes, Size: 13.7X1mm
Catalog Number:
(76468-580)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
SEM specimen mount with shorter pin and slotted head for use with all Zeiss/LEO SEM, FESEM & FIB systems, Made from ultra-pure aluminum with a standard lathe finish, Head: 2.5, Pin height: 6 mm, Pin diameter: 3.2 mm, 63mm
Catalog Number:
(76468-518)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Pin stub mount, for use with Amray, Cambridge, Leica, Zeiss/Leo, Fei/Philips, CanScan, and Tescan, Made from ultra-pure aluminum with a standard lathe finish, Head: 100 mm, Pin diameter: 3.2 mm.
Catalog Number:
(76468-662)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Sem Pin Mount Preparation Stand, This stand is made from Aluminum and measures 2.4 (61mm) x 0.63 (16mm) and provides a stable surface for a variety of pin mount.
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Vacuum Wand, Molded Peek Tip, 8in wafers, Wafer tips made from PEEK, a high performance plastic and are able to be used in Porta-Wand, Porta-Vac II, and EMS Vacuum Wand Kits, Withstand temperatures up to 100C, Thin profile to allow easy access to wafers.
Catalog Number:
(76468-632)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Multi Holder, For 8 Pin Stubs Zeiss, Multi pin holder is made from machined aluminum with stainless steel Allen wrench screws, Accommodates up to eight standard 12.7mm (1/2) pin stubs, 50mm, Type: Zeiss with Built-in Dovetail.
Catalog Number:
(76468-586)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
SEM specimen mount with shorter pin and slotted head for use with all Zeiss/LEO SEM, FESEM & FIB systems, Made from ultra-pure aluminum with a standard lathe finish, Head: 2, Pin height: 6 mm, Pin diameter: 3.2 mm, 50mm
Catalog Number:
(76468-796)
Supplier:
ELECTRON MICROSCOPY SCIENCE
Description:
Pin Stub Holder Adapter, Cambridge, will convert 1/8 (3.1 mm) pin stub holders to the re-entrant type 1 1/4 (32 mm).
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Stock for this item is limited, but may be available in a warehouse close to you. Please make sure that you are logged in to the site so that available stock can be displayed. If the
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