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Electron Microscopy Sciences

15,606  results were found

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Description:   EM Regent Vial Cap
Catalog Number: 102101-382
Supplier: Electron Microscopy Sciences



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Description:   For surfacing sectioning of biological and industrial specimens for AFM. Produces extremely smooth sample surfaces with the best possible structure preservation.
Catalog Number: 102680-692
Supplier: Electron Microscopy Sciences



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Description:   Used for all low temperature sectioning of cryo-specimens, frozen hydrated specimens and polymers and rubber.
Catalog Number: 102680-794
Supplier: Electron Microscopy Sciences



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Description:   For all low temperature sectioning of cryo-protected specimens, frozen hydrated specimens, polymers and rubber.
Catalog Number: 102680-716
Supplier: Electron Microscopy Sciences



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Description:   Accessory for TL-MS2micro Saw-Diamond Saw Part of the XTEM preparation kit as a sectioning tool
Catalog Number: 102680-882
Supplier: Electron Microscopy Sciences



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Description:   Recognized as the diamond knife for routine sectioning.
Catalog Number: 102680-730
Supplier: Electron Microscopy Sciences



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Description:   For all low temperature sectioning of cryo-protected specimens, frozen hydrated specimens, polymers and rubber.
Catalog Number: 102680-812
Supplier: Electron Microscopy Sciences



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Description:   Used for all low temperature sectioning of cryo-specimens, frozen hydrated specimens and polymers and rubber.
Catalog Number: 102680-756
Supplier: Electron Microscopy Sciences



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Description:   Quality 0.45m MCE filter material; 5.0um Filter is placed under the 0.45m filter as a diffuser; 2IN Static conductive extension cowl. Meets NIOSH 7402 specifications; Meets AEHRA requirements; Preloaded - ready-to-use.
Catalog Number: 102681-078
Supplier: Electron Microscopy Sciences



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Description:   Machined aluminum with stainless steel allen screws is specifically for 1IN or 2m metallurgical mounts.
Catalog Number: 102681-232
Supplier: Electron Microscopy Sciences



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Description:   Sampling stand used to support cassettes at elevated levels. ABS-1 Deluxe Sampling Stand: very similar to the economy stand but made in the USA from aluminum. Better durability and stability than the economy one.
Catalog Number: 102681-136
Supplier: Electron Microscopy Sciences



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Description:   Provided with a 90 degree cone angle and a 15m radius round tip. Flat Tip and Sharp tip can be ordered. LaB6 offers ten times the brightness of tungsten, long life (up to 500 hours) and a stability of better than 3% per hour at 1550 degreeC.
Catalog Number: 102681-468
Supplier: Electron Microscopy Sciences



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Product Image
Description:   Provided with a 90 degree cone angle and a 15m radius round tip. Flat Tip and Sharp tip can be ordered. LaB6 offers ten times the brightness of tungsten, long life (up to 500 hours) and a stability of better than 3% per hour at 1550 degreeC.
Catalog Number: 102681-432
Supplier: Electron Microscopy Sciences



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Description:   Machined aluminum with stainless steel Alen screws is specifically for 1 1/4IN and 30mm metallurgical mounts.
Catalog Number: 102681-236
Supplier: Electron Microscopy Sciences



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Product Image
Description:   Provided with a 90 degree cone angle and a 15m radius round tip. Flat Tip and Sharp tip can be ordered. LaB6 offers ten times the brightness of tungsten, long life (up to 500 hours) and a stability of better than 3% per hour at 1550 degreeC.
Catalog Number: 102681-426
Supplier: Electron Microscopy Sciences



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Description:   Made from aluminum with copper clips and brass screws. The unit measures 55x30x8mm and holds a standard geological thin section. 2 clips to insure nothing moves. The holder has convenient tweezer inserts which allow for easy loading.
Catalog Number: 102681-248
Supplier: Electron Microscopy Sciences



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Product Image
Description:   Provided with a 90 degree cone angle and a 15m radius round tip. Flat Tip and Sharp tip can be ordered. LaB6 offers ten times the brightness of tungsten, long life (up to 500 hours) and a stability of better than 3% per hour at 1550 degreeC.
Catalog Number: 102681-404
Supplier: Electron Microscopy Sciences



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Description:   TEM grid holder with stations for 2 TEM grids and 2 sample stubs. Long post - standard is 1/8IN (3.2m) diameter x 0.32IN (8.1mm) length. Comes with 2 sample stubs. Stainless Steel is very slightly magnetic.
Catalog Number: 102681-310
Supplier: Electron Microscopy Sciences



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Product Image
Description:   Provided with a 90 degree cone angle and a 15m radius round tip. Flat Tip and Sharp tip can be ordered. LaB6 offers ten times the brightness of tungsten, long life (up to 500 hours) and a stability of better than 3% per hour at 1550 degreeC.
Catalog Number: 102681-450
Supplier: Electron Microscopy Sciences



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Product Image
Description:   Provided with a 90 degree cone angle and a 15m radius round tip. Flat Tip and Sharp tip can be ordered. LaB6 offers ten times the brightness of tungsten, long life (up to 500 hours) and a stability of better than 3% per hour at 1550 degreeC.
Catalog Number: 102681-452
Supplier: Electron Microscopy Sciences



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Description:   It Is A Perforated Support Foil With Pre-Defined Hole Size, Shape And Arrangement. It Has Advantages In Electron Microscopy (Em) Or Low-Energy Electron Point Source (Leeps) Microscopy When Compared With Convention
Catalog Number: 102773-238
Supplier: Electron Microscopy Sciences



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Description:   For all low temperature sectioning of cryo-protected specimens, frozen hydrated specimens, polymers and rubber.
Catalog Number: 102680-774
Supplier: Electron Microscopy Sciences



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Description:   Ultratrim for the trimming of epoxy and acrylic embeddings as well as polymers and non-ferrous metals.
Catalog Number: 102681-540
Supplier: Electron Microscopy Sciences



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Product Image
Description:   Provided with a 90 degree cone angle and a 15m radius round tip. Flat Tip and Sharp tip can be ordered. LaB6 offers ten times the brightness of tungsten, long life (up to 500 hours) and a stability of better than 3% per hour at 1550 degreeC.
Catalog Number: 102681-396
Supplier: Electron Microscopy Sciences



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Description:   It Is A Perforated Support Foil With Pre-Defined Hole Size, Shape And Arrangement. It Has Advantages In Electron Microscopy (Em) Or Low-Energy Electron Point Source (Leeps) Microscopy When Compared With Convention
Catalog Number: 102773-208
Supplier: Electron Microscopy Sciences



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Description:   It Is A Perforated Support Foil With Pre-Defined Hole Size, Shape And Arrangement. It Has Advantages In Electron Microscopy (Em) Or Low-Energy Electron Point Source (Leeps) Microscopy When Compared With Convention
Catalog Number: 102773-226
Supplier: Electron Microscopy Sciences



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Product Image
Description:   Provided with a 90 degree cone angle and a 15m radius round tip. Flat Tip and Sharp tip can be ordered. LaB6 offers ten times the brightness of tungsten, long life (up to 500 hours) and a stability of better than 3% per hour at 1550 degreeC.
Catalog Number: 102681-410
Supplier: Electron Microscopy Sciences



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Description:   Recognized as the diamond knife for routine sectioning.
Catalog Number: 102680-828
Supplier: Electron Microscopy Sciences



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Product Image
Description:   Provided with a 90 degree cone angle and a 15m radius round tip. Flat Tip and Sharp tip can be ordered. LaB6 offers ten times the brightness of tungsten, long life (up to 500 hours) and a stability of better than 3% per hour at 1550 degreeC.
Catalog Number: 102681-402
Supplier: Electron Microscopy Sciences



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Description:   It Is A Perforated Support Foil With Pre-Defined Hole Size, Shape And Arrangement. It Has Advantages In Electron Microscopy (Em) Or Low-Energy Electron Point Source (Leeps) Microscopy When Compared With Convention
Catalog Number: 102773-204
Supplier: Electron Microscopy Sciences



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Product Image
Description:   It Is A Perforated Support Foil With Pre-Defined Hole Size, Shape And Arrangement. It Has Advantages In Electron Microscopy (Em) Or Low-Energy Electron Point Source (Leeps) Microscopy When Compared With Convention
Catalog Number: 102773-194
Supplier: Electron Microscopy Sciences



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Product Image
Description:   It Is A Perforated Support Foil With Pre-Defined Hole Size, Shape And Arrangement. It Has Advantages In Electron Microscopy (Em) Or Low-Energy Electron Point Source (Leeps) Microscopy When Compared With Convention
Catalog Number: 102773-296
Supplier: Electron Microscopy Sciences



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Description:   It Is A Perforated Support Foil With Pre-Defined Hole Size, Shape And Arrangement. It Has Advantages In Electron Microscopy (Em) Or Low-Energy Electron Point Source (Leeps) Microscopy When Compared With Convention
Catalog Number: 102773-236
Supplier: Electron Microscopy Sciences



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Product Image
Description:   It Is A Perforated Support Foil With Pre-Defined Hole Size, Shape And Arrangement. It Has Advantages In Electron Microscopy (Em) Or Low-Energy Electron Point Source (Leeps) Microscopy When Compared With Convention
Catalog Number: 102773-270
Supplier: Electron Microscopy Sciences



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Product Image
Description:   It Is A Perforated Support Foil With Pre-Defined Hole Size, Shape And Arrangement. It Has Advantages In Electron Microscopy (Em) Or Low-Energy Electron Point Source (Leeps) Microscopy When Compared With Convention
Catalog Number: 102773-234
Supplier: Electron Microscopy Sciences



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Description:   It Is A Perforated Support Foil With Pre-Defined Hole Size, Shape And Arrangement. It Has Advantages In Electron Microscopy (Em) Or Low-Energy Electron Point Source (Leeps) Microscopy When Compared With Convention
Catalog Number: 102773-416
Supplier: Electron Microscopy Sciences



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Product Image
Description:   It Is A Perforated Support Foil With Pre-Defined Hole Size, Shape And Arrangement. It Has Advantages In Electron Microscopy (Em) Or Low-Energy Electron Point Source (Leeps) Microscopy When Compared With Convention
Catalog Number: 102773-454
Supplier: Electron Microscopy Sciences



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Product Image
Description:   It Is A Perforated Support Foil With Pre-Defined Hole Size, Shape And Arrangement. It Has Advantages In Electron Microscopy (Em) Or Low-Energy Electron Point Source (Leeps) Microscopy When Compared With Convention
Catalog Number: 102773-460
Supplier: Electron Microscopy Sciences



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Product Image
Description:   It Is A Perforated Support Foil With Pre-Defined Hole Size, Shape And Arrangement. It Has Advantages In Electron Microscopy (Em) Or Low-Energy Electron Point Source (Leeps) Microscopy When Compared With Convention
Catalog Number: 102773-302
Supplier: Electron Microscopy Sciences



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Product Image
Description:   It Is A Perforated Support Foil With Pre-Defined Hole Size, Shape And Arrangement. It Has Advantages In Electron Microscopy (Em) Or Low-Energy Electron Point Source (Leeps) Microscopy When Compared With Convention
Catalog Number: 102773-412
Supplier: Electron Microscopy Sciences



Quantity:
 
 
 
   
Product Image
Description:   It Is A Perforated Support Foil With Pre-Defined Hole Size, Shape And Arrangement. It Has Advantages In Electron Microscopy (Em) Or Low-Energy Electron Point Source (Leeps) Microscopy When Compared With Convention
Catalog Number: 102773-496
Supplier: Electron Microscopy Sciences



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Description:   Formvar/Carbon Film Single Hole Grid, Type: 800 um, Thickness: 5-6 nm/1 nm, Ultra-Thin A, Coating: Nickel, carbon : Formvar stabilized with evaporated carbon film provides excellent support especially for ultrathin sections
Catalog Number: 103304-208
Supplier: Electron Microscopy Sciences



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Description:   Carbon Support Film Thin Bar Square, Type: 1000 Mesh, Thickness: 3-4 nm Ultra-Thin, Coating: Copper A thin film of pure carbon deposited on the shiny side of the grid (are optically checked), Silicone free, Application: Electron Microscopy
Catalog Number: 103304-830
Supplier: Electron Microscopy Sciences



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Description:   Carbon Support Film Single Hole, Type: 200 um, Thickness: 3-4 nm Ultra-Thin, Coating: Nickel A thin film of pure carbon deposited on the shiny side of the grid (are optically checked), Silicone free, Application: Electron Microscopy
Catalog Number: 103304-782
Supplier: Electron Microscopy Sciences



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Description:   Formvar/Carbon Support Film Slot Grid, Type: 2x1mm, Thickness: Ultra-Thin Option C,  5-6nm/20-30nm, Coating: Copper, Formvar stabilized with evaporated carbon film provides excellent support for ultrathin sections and specimen support
Catalog Number: 103304-884
Supplier: Electron Microscopy Sciences



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Description:   Formvar/Carbon Support Film Slot Grid, Type: 2x1mm, Thickness: Extra Thick Option B,  25-50nm/3-4nm, Coating: Copper, Formvar stabilized with evaporated carbon film provides excellent support for ultrathin sections and specimen support
Catalog Number: 103304-888
Supplier: Electron Microscopy Sciences



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Description:   Formvar/Carbon Film Hexagonal Grid, Type: 100 Mesh, Thickness: 15-20nm Formvar and 3-4nm Carbon, Thick B, Coating: Gold Formvar stabilized with evaporated carbon film provides excellent support for ultrathin sections Electron Microscopy
Catalog Number: 103305-086
Supplier: Electron Microscopy Sciences



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Description:   Formvar/Carbon Support Film Slot Grid, Type: 2X0.05mm, Thickness: Ultra-Thin Option A,  5-6nm/1nm, Coating: Nickel, Formvar stabilized with evaporated carbon film provides excellent support for ultrathin sections and specimen support
Catalog Number: 103304-808
Supplier: Electron Microscopy Sciences



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Description:   Formvar/Carbon Film Single Hole Grid, Type: 800 um, Thickness: 15-20 nm/20-30 nm, Thick C, Coating: Nickel, carbon : Formvar stabilized with evaporated carbon film provides excellent support especially for ultrathin sections
Catalog Number: 103304-460
Supplier: Electron Microscopy Sciences



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Description:   Formvar/Carbon Film Thin Bar Hexagonal Grid, Type: 600 mesh, Thickness: Standard Option B: 10 nm/3-4 nm Carbon, Coating: Nickel, carbon: Formvar stabilized with evaporated carbon provides excellent support especially for ultrathin Sections
Catalog Number: 103305-192
Supplier: Electron Microscopy Sciences



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Description:   Formvar/Carbon Film Thin Bar Hexagonal Grid, Type: 400 mesh, Thickness: Ultra-Thin Option A: 5-6 nm/1 nm carbon, Coating: Nickel, carbon: Formvar stabilized with evaporated carbon provides excellent support especially for ultrathin Sections
Catalog Number: 103305-186
Supplier: Electron Microscopy Sciences



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Description:   Carbon Support Film Single Hole, Type: 600 um, Thickness: 20-30 nm Extra Thick, Coating: Nickel A thin film of pure carbon deposited on the shiny side of the grid (are optically checked), Silicone free, Application: Electron Microscopy
Catalog Number: 103304-932
Supplier: Electron Microscopy Sciences



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Description:   Formvar/Carbon Film Thin Bar Square Grid, Type: 200 mesh, Thickness: Thick option C: 15-20 nm Formvar/20-30 nm carbon, Coating: Copper, carbon: Formvar stabilized with evaporated carbon provides excellent support for ultrathin Sections
Catalog Number: 103304-962
Supplier: Electron Microscopy Sciences



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Description:   Formvar/Carbon Film Thin Bar Hexagonal Grid, Type: 200 mesh, Thickness: Thick option A: 15-20 nm/1 nm carbon, Coating: Nickel, carbon: Formvar stabilized with evaporated carbon provides excellent support especially for ultrathin Sections
Catalog Number: 103305-252
Supplier: Electron Microscopy Sciences



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Description:   Formvar/Carbon Film Hexagonal Grid, Type: 300mesh, Thickness: Standard Option B,  10nm/3-4nm, Coating: Gold, Formvar stabilized with evaporated carbon film provides excellent support especially for ultrathin sections and specimen support
Catalog Number: 103304-520
Supplier: Electron Microscopy Sciences



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Description:   Formvar/Carbon Film Thin Bar Hexagonal Grid, Type: 200 mesh, Thickness: Extra thick option B: 25-50 nm/3-4 nm, Coating: Copper, carbon: Formvar stabilized with evaporated carbon provides excellent support especially for ultrathin Sections
Catalog Number: 103305-022
Supplier: Electron Microscopy Sciences



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Product Image
Description:   Formvar/Carbon Support Film Slot Grid, Type: 2X0.05mm, Thickness: Thick Option C,  15-20nm/20-30nm, Coating: Gold, Formvar stabilized with evaporated carbon film provides excellent support for ultrathin sections and specimen support
Catalog Number: 103305-352
Supplier: Electron Microscopy Sciences



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Product Image
Description:   Formvar/Carbon Film Thin Bar Hexagonal Grid, Type: 200 mesh, Thickness: Thick option B: 15-20 nm/3-4 nm carbon, Coating: Nickel, carbon: Formvar stabilized with evaporated carbon provides excellent support especially for ultrathin Sections
Catalog Number: 103305-254
Supplier: Electron Microscopy Sciences



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Description:   Formvar Support Film London Finder Grid, Type: LF135, Thickness: Standard, 15-20nm, Coating: Nickel, Thin film of formvar resin coats the shiny side of a London finder grid, Coated grids are optically checked and batch tested, Silicone free
Catalog Number: 103305-104
Supplier: Electron Microscopy Sciences



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Description:   Formvar/Carbon Film Thin Bar Square Grid, Type: 1000 mesh, Thickness: Standard option C: 10 nm Formvar/20-30 nm carbon, Coating: Nickel, carbon: Formvar stabilized with evaporated carbon provides excellent support for ultrathin Sections
Catalog Number: 103305-162
Supplier: Electron Microscopy Sciences



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Description:   Formvar/Carbon Film Thin Bar Square Grid, Type: 200 mesh, Thickness: Extra thick option B: 25-50 nm Fromvar/3-4 nm carbon, Coating: Copper, carbon: Formvar stabilized with evaporated carbon provides excellent support for ultrathin Sections
Catalog Number: 103305-016
Supplier: Electron Microscopy Sciences



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Description:   Formvar/Carbon Film Thin Bar Square Grid, Type: 1000 mesh, Thickness: Thick option A: 15-20 nm Formvar/1 nm carbon, Coating: Nickel, carbon: Formvar stabilized with evaporated carbon provides excellent support for ultrathin Sections
Catalog Number: 103305-246
Supplier: Electron Microscopy Sciences



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Product Image
Description:   Formvar/Carbon Support Film Slot Grid, Type: 2x1mm, Thickness: Extra Thick Option B,  25-50nm/3-4nm, Coating: Gold, Formvar stabilized with evaporated carbon film provides excellent support for ultrathin sections and specimen support
Catalog Number: 103305-278
Supplier: Electron Microscopy Sciences



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Description:   Tris Buffered Saline
Catalog Number: 102091-782
Supplier: Electron Microscopy Sciences



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